non destructive testing amorphous silicon a si

Brand Name:HUATEC

Model Number:H3543HWF-AG

Place of Origin:China

...Amorphous Silicon A-Si Curved A-Si DR And Non-Destructive Testing H3543HWF-AG It is a portable wireless flat detector based on amorphous silicon surface sensor, suitable for pipeline inspection, industrial inspection, non-destructive testing and other fields Sensor Receptor Type a-Si...

Brand Name:HUATEC

Model Number:H3543HWF-AG

Place of Origin:China

H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel Sensor Receptor Type a-Si Scintillator Gos Active Area 350 x 430 mm Resolution 2560 x 3072 Pixel Pitch 139 μm Electricals and interface A/D Conversion 16 bits Data Interface Gigabit Ethernet/802.11ac...

Brand Name:UNICOMP

Model Number:UNC320

Place of Origin:China

UNC Series NDT X-Ray Equipment (DR) Product Description: Mainly used in metal castings, hardware products, plastic products, refractory materials, resin materials, composite materials, ceramic body and welding metal parts and other small products for non-...

Brand Name:IRAYPLE

Model Number:AH7500CU000

Place of Origin:China

Product Overview and Key Specifications The IRAYPLE AH7500CU000 is a high-performance, uncooled amorphous silicon (a-Si) microbolometer infrared detector core module engineered for reliable thermal imaging in industrial automation. It serves as the core ...

Brand Name:WELLMAN

Model Number:Ultra-One 3D/CT

Place of Origin:CHINA

...Non-Destructive Testing Equipment Technical Specifications X-ray Source Parameters X-ray Tube Type Closed-tube X-ray source Tube voltage range 20-160 KV Detector parameter Detector type Amorphous silicon fat panel detector Pixel size 100 μm Pixel matrix 1536*1536 Equipment Performance Parameters Details Maximum possible sample size Flat test bench 580*530mm Rotating test stand 300*300mm Rollover test...