multiangle wafer defect inspection system

Brand Name:Mento

Place of Origin:China dongguan

Model Number:K2012XL1200

Product Description: The AOI Inspection Equipment is designed to provide maximum inspection accuracy and speed. With high-resolution capabilities, it provides a clear and detailed image of the PCBs. This allows for superior inspection results and ensures...

Brand Name:YUSH

Model Number:YS-8500

Place of Origin:Guangdong

...Inspection System ,YS-8500 adopts COMET's open X-ray tube design,and its defect inspection capability can reach 0.5um.It can realize 2D/3D/CT and other inspection methods,and is suitable for quality inspection,3D measurement and non-destructive analysis. Application Advantages With planar CT function(PCT),it can be applied to 3D/CT inspection of printed circuit boards,SMT,IGBT,wafers...

Brand Name:JC

Place of Origin:China

Model Number:QTZL-001

High Transparency Round Quartz Lens for Wafer Defect Inspection Machines quartz lens function to manipulate light by refracting, reflecting, and focusing it, similar to a glass lens, but with superior properties like high transparency across UV, visible...

Model Number:NCJ-1600

Place of Origin:China

... with reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface inclusions and defects, crystallography,

Brand Name:YUSH

Model Number:YS-8500

Place of Origin:GuangDong

...Inspection System ,YS-8500 adopts COMET's open X-ray tube design,and its defect inspection capability can reach 0.5um.It can realize 2D/3D/CT and other inspection methods,and is suitable for quality inspection,3D measurement and non-destructive analysis. Application Advantages With planar CT function(PCT),it can be applied to 3D/CT inspection of printed circuit boards,SMT,IGBT,wafers...

Brand Name:Jietai

Model Number:JTM-10720AD

Place of Origin:Dongguan, Guangdong

...Silicon Wafers Full-process Traceability, Cleanliness Meeting IATF 16949 Standard Closed-loop Online Inspection to Prevent Defective Products from Leaving the Line Machine Vision Sampling Inspection: One piece is automatically selected for inspection out ...

Model Number:5w 5050 high power LED

Brand Name:BOSMFC

Place of Origin:China

...super bright for wafer inspetion This 5W 3535 high-power red LED chip delivers superb brightness, specifically engineered for wafer inspection. It provides highly uniform and stable illumination, clearly revealing surface micro-defects. Designed to enhance...

Model Number:MV-CH250-90Y1M-NH

Brand Name:Hikrobot

Place of Origin:China

...Defect Area Scan Camera MV-CH250-90Y1M-NH — 25MP CXP-12 Mono Camera Hikrobot 25MP mono camera utilizes GMAX0505 global shutter technology, delivering 5120×5120 resolution at 41.3fps with 1-link CXP-12 interface, C-Mount compatibility, integrated heatsink, and 9-24V PoCXP power supply. High-Resolution Vision for Semiconductor & AOI Applications Ideal for wafer inspection...