Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
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... Both plunger and barrel are gold-plated to ensure low contact resistance, stable signal transmission, and long service life under repeated testing cycles. 3. Multiple Tip Styles Available Supports B tip (60° cone), U tip, D tip,...
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
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Highly Customizable IC Test Sockets Featuring Spring Loaded Pins Or Pogo Pins With Thermal Solution For Testing Performance
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Product Description: Our IC Test Sockets are precision-engineered solutions designed specifically for Electronic Components Testing Sockets applications, providing reliable and efficient connectivity for semiconductor devices during testing procedures......
Sireda Technology Co., Ltd.
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IEC61032 Figure 8 Test Probe 12
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...pin is intended to be used on appliances for verifying the inaccessibility of hazardous live parts or hazardous mechanical parts which are liable to be touched accidentally by a tool, for example a screwdriver or similar pointed object in normal use. It meets IEC61032 figure 8 test probe 12. Handle is made of nylon while the tip is made of hardened steel. Customizable......
Dongguan Kingpo Technology Limited
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