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| Categories | Thermal Conductivity Meter |
|---|---|
| Brand Name: | BAXIT |
| Model Number: | BXT-DR-S |
| Certification: | CE,ISO |
| Place of Origin: | China |
| MOQ: | 1 set |
| Price: | US $5880 / Unit |
| Payment Terms: | L/C,D/A,D/P,T/T,Western Union,MoneyGram |
| Supply Ability: | 500 set/sets per month |
| Delivery Time: | 5-8 work days |
| Packaging Details: | export wooden box |
| Test Range: | 0.001-300W/(m*K) |
| Measure the temperature range of the sample: | -20 ℃ -320 ℃ (requires optional external temperature control equipment) |
| Sample temperature rise: | <15 ° C |
| Test sample power P: | No. 1 probe power 0
|
| Probe diameter: | ±3% |
| Repeatability error: | ≤3% |
| Measure time: | 5~160s |
| Company Info. |
| Shanghai Glomro Industrial Co., Ltd. |
| Verified Supplier |
| View Contact Details |
| Product List |
Transient Plane Heat Source Method Thermal Conductivity Meter

Instrument Introduction
BXT-DR-S is a thermal conductivity tester developed using transient
planar heat source technology (TPS), which can be used to test the
thermal conductivity performance of various types of materials. The
transient planar heat source method is the latest type of m
ethod for studying thermal conductivity performance, which has
taken measurement techniques to a whole new level. The ability to
quickly and accurately measure thermal conductivity when studying
materials provides great convenience for enterprise quality
monitoring, material production, and laboratory research. The
instrument is easy to operate, the method is simple and easy to
understand, and it will not cause damage to the tested sample.

Working principle
Transient planar heat source technology (TPS) is a novel method for
measuring thermal conductivity. The principle of determining the
thermal properties of materials is based on the transient
temperature response generated by a disc-shaped heat source with
step heating in an infinite medium. Using thermal resistant
materials to create a flat probe that serves as both a heat source
and a temperature sensor. The thermal resistance coefficient of an
alloy is linearly related to temperature and resistance, which
means that by understanding the change in resistance, the heat loss
can be determined, thereby reflecting the thermal conductivity of
the s
ample. The probe of this method is a continuous double helix
structure thin film formed by etching conductive alloy, with a
double-layer insulating protective layer on the outer layer and a
very thin thickness, which gives the probe a certain mechanical
strength and maintains electrical insulation with the sample.
During the testing process, the probe is placed in the middle of
the sample for testing. When current passes through the probe, a
certain temperature rise is generated, and the heat generated
simultaneously diffuses to the samples on both sides of the probe.
The speed of thermal diffusion depends on the thermal conductivity
characteristics of the material. By recording the temperature and
the response time of the probe, the thermal conductivity can be
directly obtained from a mathematical model.

Test object
Metals, ceramics, alloys, ores, polymers, composites, paper,
fabrics, foamed plastics (thermal insulation materials and plates
with flat surfaces), mineral wool, cement w
alls, glass reinforced composite plates CRC, cement polystyrene
plates, sandwich concrete, glass reinforced steel panel composite
plates, paper honeycomb plates, colloids, liquids, powders,
granular and paste solids, etc., have a wide range of test objects.

Main features
>u >Reference standards for whole machine instruments: ISO 22007-2;
>u >The testing scope is wide, the testing performance is stable, and it is at the leading level among similar instruments in China;
>u >Direct measurement, with a testing time of about 5-160 seconds that can be set, can quickly and accurately measure the thermal conductivity, saving a lot of time;
>u >It will not be affected by contact thermal resistance like the static method;
>u >No special sample preparation is required, and there are no specific requirements for sample shape. Solid blocks only need a relatively smooth sample surface and a length and width that is at least twice the diameter of the probe;
>u >Performing non-destructive testing on samples means that they can be reused;
>u >The probe adopts a double helix structure for design, combined with a dedicated mathematical model, and uses core algorithms to analyze and calculate the data collected on the probe;
>u >The structure design of the sample table is clever, easy to operate, suitable for placing samples of different thicknesses, and simple and beautiful at the same time;
>u >The data acquisition on the probe uses imported data acquisition
chip
s, which have high resolution and can make the test results more
accurate and reliable;
>u >The control system of the host uses ARM microprocessors, which have faster processing speed than traditional microprocessors, improving the system's analysis and processing capabilities, and resulting in more accurate calculation results;
>u >The instrument can be used for the determination of thermal properties such as block solids, paste solids, granular solids, colloids, liquids, powders, coatings, films, insulation materials, etc;
>u >Intelligent human-machine interface, color LCD display, touch screen control, easy and simple operation;
>u >Powerful data processing capabilities. A highly automated computer data communication and report processing system.
Technical parameter
Test Range | 0.001-300W/(m*K) |
Measure the temperature range of the sample | -20 ℃ -320 ℃ (requires optional external temperature control equipment) |
Probe diameter | No. 1 probe 7.5mm; No. 2 probe 15mm;No. probe 30mm |
Precision | ±3% |
Repeatability error | ≤3% |
Measure time | 5~160s |
Power supply | AC 220V |
Total power | ﹤500w |
Sample temperature rise | ﹤15℃ |
Test sample power P | No. 1 probe power 0<P<1w; No. 2 probe power 0<P<14w No. 3 probe power 0<P<14w |
Sample specifications | Single sample measured by probe No. 1 (15*15*3.75mm) Single sample measured by the No. 2 probe (30*30*7.5mm) Single sample measured by the No. 3 probe (60*60*2mm) |
Note: Probe 1 measures thin low conductivity materials, probe 2 is a conventional universal probe, and probe 3 measures high conductivity materials with high thermal conductivity. If the surface of the tested sample is smooth, flat, and sticky, the sample can be stacked. | |
Compared to other methods, it is faster
, simpler, and more comprehensive
Transient planar heat source method | Laser method | Hotline method | Protection plate method | ||
Measurement methods | Non-steady state method | Non-steady state method | Non-steady state method | Steady state method | |
Measure physical properties | Get thermal conductivity and thermal diffusivity directly | Directly obtain the thermal diffusivity and specific heat, and calculate the thermal conductivity from the input sample density value | Get thermal conductivity directly | Get thermal conductivity directly | |
Scope of application | Solid,liquid, powder, paste,colloid, granule | Solid | Solid, liquid | Solid | |
Sample Preparation | No special requirements, simple sample preparation | Complex sample preparation | Simple sample preparation with specific requirements | Large sample size | |
Measurement accuracy | ± 3%,preferably ± 0.5% | Preferably up to ± 10% | Preferably up to ± 5% | Preferably up to ±3% | |
Physical model | Planar heat source contact measurement, as long as the limited surface contact is good | Non-contact heat source | Wire heat source, the wire model must be in good contact | Heat source contact type, need good surface contact | |
Thermal conductivity range[w/(m*k)] | 0.005-300 | 10-500 | 0.005-10 | 0.005-5 | |
Measure time | 5-160S | A few minutes | Tens of minutes | Hours | |
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