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TPS Transient Plane Source Thermal Conductivity Analyzer for Metal Ceramic Composite Materials

Categories Thermal Conductivity Meter
Brand Name: BAXIT
Model Number: BXT-DR-S
Certification: CE,ISO
Place of Origin: China
MOQ: 1 set
Price: US $5880 / Unit
Payment Terms: L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability: 500 set/sets per month
Delivery Time: 5-8 work days
Packaging Details: export wooden box
Test Range: 0.001-300W/(m*K)
Measure the temperature range of the sample: -20 ℃ -320 ℃ (requires optional external temperature control equipment)
Sample temperature rise: <15 ° C
Test sample power P: No. 1 probe power 0
Probe diameter: ±3%
Repeatability error: ≤3%
Measure time: 5~160s
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TPS Transient Plane Source Thermal Conductivity Analyzer for Metal Ceramic Composite Materials

Transient Plane Heat Source Method Thermal Conductivity Meter



Instrument Introduction

BXT-DR-S is a thermal conductivity tester developed using transient planar heat source technology (TPS), which can be used to test the thermal conductivity performance of various types of materials. The transient planar heat source method is the latest type of m
ethod for studying thermal conductivity performance, which has taken measurement techniques to a whole new level. The ability to quickly and accurately measure thermal conductivity when studying materials provides great convenience for enterprise quality monitoring, material production, and laboratory research. The instrument is easy to operate, the method is simple and easy to understand, and it will not cause damage to the tested sample.

Working principle

Transient planar heat source technology (TPS) is a novel method for measuring thermal conductivity. The principle of determining the thermal properties of materials is based on the transient temperature response generated by a disc-shaped heat source with step heating in an infinite medium. Using thermal resistant materials to create a flat probe that serves as both a heat source and a temperature sensor. The thermal resistance coefficient of an alloy is linearly related to temperature and resistance, which means that by understanding the change in resistance, the heat loss can be determined, thereby reflecting the thermal conductivity of the s
ample. The probe of this method is a continuous double helix structure thin film formed by etching conductive alloy, with a double-layer insulating protective layer on the outer layer and a very thin thickness, which gives the probe a certain mechanical strength and maintains electrical insulation with the sample. During the testing process, the probe is placed in the middle of the sample for testing. When current passes through the probe, a certain temperature rise is generated, and the heat generated simultaneously diffuses to the samples on both sides of the probe. The speed of thermal diffusion depends on the thermal conductivity characteristics of the material. By recording the temperature and the response time of the probe, the thermal conductivity can be directly obtained from a mathematical model.




Test object

Metals, ceramics, alloys, ores, polymers, composites, paper, fabrics, foamed plastics (thermal insulation materials and plates with flat surfaces), mineral wool, cement w
alls, glass reinforced composite plates CRC, cement polystyrene plates, sandwich concrete, glass reinforced steel panel composite plates, paper honeycomb plates, colloids, liquids, powders, granular and paste solids, etc., have a wide range of test objects.




Main features

u Reference standards for whole machine instruments: ISO 22007-2

u The testing scope is wide, the testing performance is stable, and it is at the leading level among similar instruments in China;

u Direct measurement, with a testing time of about 5-160 seconds that can be set, can quickly and accurately measure the thermal conductivity, saving a lot of time;

u It will not be affected by contact thermal resistance like the static method;

u No special sample preparation is required, and there are no specific requirements for sample shape. Solid blocks only need a relatively smooth sample surface and a length and width that is at least twice the diameter of the probe;

u Performing non-destructive testing on samples means that they can be reused;

u The probe adopts a double helix structure for design, combined with a dedicated mathematical model, and uses core algorithms to analyze and calculate the data collected on the probe;

u The structure design of the sample table is clever, easy to operate, suitable for placing samples of different thicknesses, and simple and beautiful at the same time;

u The data acquisition on the probe uses imported data acquisition chip
s, which have high resolution and can make the test results more accurate and reliable;

u The control system of the host uses ARM microprocessors, which have faster processing speed than traditional microprocessors, improving the system's analysis and processing capabilities, and resulting in more accurate calculation results;

u The instrument can be used for the determination of thermal properties such as block solids, paste solids, granular solids, colloids, liquids, powders, coatings, films, insulation materials, etc;

u Intelligent human-machine interface, color LCD display, touch screen control, easy and simple operation;

u Powerful data processing capabilities. A highly automated computer data communication and report processing system.



Technical parameter

Test Range

0.001-300W/(m*K)

Measure the temperature

range of the sample

-20 ℃ -320 ℃

(requires optional external temperature control equipment)

Probe diameter

No. 1 probe 7.5mm; No. 2 probe 15mmNo. probe 30mm

Precision

±3%

Repeatability error

≤3%

Measure time

5~160s

Power supply

AC 220V

Total power

500w

Sample temperature rise

15℃

Test sample power P

No. 1 probe power 0<P<1w;

No. 2 probe power 0<P<14w

No. 3 probe power 0<P<14w

Sample specifications

Single sample measured by probe No. 1 (15*15*3.75mm)

Single sample measured by the No. 2 probe (30*30*7.5mm)

Single sample measured by the No. 3 probe (60*60*2mm)

Note: Probe 1 measures thin low conductivity materials, probe 2 is a conventional universal probe,

and probe 3 measures high conductivity materials with high thermal conductivity. If the surface of

the tested sample is smooth, flat, and sticky, the sample can be stacked.


Compared to other methods, it is faster
, simpler, and more comprehensive


Transient planar heat source method

Laser method

Hotline method

Protection plate method

Measurement methods

Non-steady state method

Non-steady state method

Non-steady state method

Steady state method

Measure physical properties

Get thermal conductivity and thermal diffusivity directly

Directly obtain the thermal diffusivity and specific heat, and calculate the thermal conductivity from the input sample density value

Get thermal conductivity directly

Get thermal conductivity directly

Scope of application

Solid,liquid,

powder, paste,colloid, granule

Solid

Solid, liquid

Solid

Sample Preparation

No special

requirements, simple sample

preparation

Complex sample preparation

Simple sample

preparation with

specific requirements

Large sample size

Measurement accuracy

± 3%,preferably ± 0.5%

Preferably up to ± 10%

Preferably up to ± 5%

Preferably up to ±3%

Physical model

Planar heat source contact measurement, as long as the limited surface contact is good

Non-contact heat source

Wire heat source, the wire model must be in good contact

Heat source contact type, need good surface contact

Thermal conductivity range[w/(m*k)]

0.005-300

10-500

0.005-10

0.005-5

Measure time

5-160S

A few minutes

Tens of minutes

Hours

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