Name: HXRF450S High Stability Xray Fluorescence Coating Thickness Spectrometer
Brand: HUATEC
Price: 14145 USD

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HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer

Categories	Non Destructive Testing Equipment
Brand Name:	HUATEC
Model Number:	HXRF-450S
Certification:	CE
Place of Origin:	China
MOQ:	1 pc
Price:	USD14145/set - USD15990/set
Payment Terms:	T/T,Paypal
Supply Ability:	5sets/Month
Delivery Time:	10-15 working days after receipt of your payment
Packaging Details:	Carton packing box
Measurement element range：:	Aluminum (Al) - uranium (U)
Detector:	SDD
Test time:	10-40s
Tube current:	0-1mA(Program-controlled)
High pressure:	0-50kV(Program-controlled)
Magnification:	Optics: 40-60×
Input voltage::	AC220V±10% 50/60HZ

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Company Info.

HUATEC GROUP CORPORATION

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HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer

Product Specifications

Attribute	Value
Measurement element range	Aluminum (Al) - uranium (U)
Detector	SDD
Test time	10-40s
Tube current	0-1mA (Program-controlled)
High pressure	0-50kV (Program-controlled)
Magnification	Optics: 40-60×
Input voltage	AC220V±10% 50/60HZ

Product Overview

The HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester is a high-performance instrument designed for precise coating thickness measurement and material analysis across various industries.

Working Conditions

Operating temperature: 15-30℃
Relative humidity: 40%~50%
Power supply: AC: 220V ± 5V

Technical Performance

Excellent long-term stability with minimal calibration requirements
No sample preparation needed for coating systems, solid or liquid samples
Comprehensive performance including coating analysis, qualitative/quantitative analysis, bath analysis, and statistical functions

Applications

Ideal for electronic components, semiconductors, PCB, FPC, LED brackets, auto parts, functional plating, decorative parts, connectors, terminals, sanitary ware, jewelry and other industries for surface coating thickness measurement and material analysis.

Safety Features

Simple user interface with limited operator authorization
Supervisor maintenance capabilities
Automatic operator usage records
Automatic locking for unauthorized operation prevention
Sample chamber door sensor
X-ray warning light
Front panel security buttons

Key Features

Measures up to 5 layers (4 coating + substrate) simultaneously
Analyzes 15 elements with automatic spectral line correction
High measurement accuracy (to μin) with excellent stability
Rapid non-destructive measurement (as fast as 10s)
Analyzes solids and solutions with qualitative, semi-quantitative and quantitative capabilities
Material identification and classification detection
Comprehensive data statistics (average, standard deviation, etc.)
Multiple output options (print, PDF, Excel) with comprehensive reporting
Measurement position preview with 30× optical magnification
Global service and technical support

Technical Parameters

Parameter	Specification
Measurement element range	Aluminum (Al) - uranium (U)
Detector	SDD
Collimator types	Fixed single hole (0.15mm, 0.2mm, 0.5mm)
Optical path system	Vertical irradiation
Magnification	Optics: 40-60×
Display modes	Elemental spectrum, label pattern, elements and measurement values
Camera	High-definition industrial camera with local magnification
Applications	Single/double coating, alloy coating, electroplating solution
Input voltage	AC220V±10% 50/60HZ
Communication	High-speed USB transmission
Dimensions	555573573mm (410478245mm cavity)
X-ray source	High-precision micro-focusing light tube (W Target)
Software features	FP algorithm, automatic fault diagnosis/correction, automatic compensation

Standard Configuration

SDD Semiconductor Detector

Electrically cooled SDD semiconductor detector
Resolution: 129 ± 5 EV
Amplification circuit module for sample characteristic X-ray detection

X-ray Excitation Device

Maximum filament current output: 1mA
Semi-loss component, 50W, air cooling

High-pressure Transmitter

Maximum voltage output: 50kV
Minimum 5kV controllable adjustment
Self-contained voltage overload protection

HXRF-450S XRF Thickness Tester front view

HXRF-450S XRF Thickness Tester side view

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HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer

HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer

HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer

X-ray fluorescence coating thickness gauge

High stability XRF spectrometer

Non-destructive coating thickness analyzer

HXRF-450S High Stability X-ray Fluorescence Coating Thickness Spectrometer