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FG FG-ST-C-16P-1030017

Categories USB DVI HDMI Connectors
Packaging Details: SMD
Connect-Disconnect Life: 10,000 cycles
MOQ: 700
Brand Name: FG-ST-C-16P-1030017
Model Number: FG-ST-C-16P-1030017
Delivery Time: 7-14工作日
Connector Type: Type-C
Description: Type-C SMD USB, DVI, HDMI Connector Adapters RoHS
length: 7.9mm
Stock: 7000
Operating temperature: -40℃~+85℃
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FG FG-ST-C-16P-1030017

Product Overview

This specification covers the requirements for product performance and test methods for USB C TYPE plug and receptacle Connectors.

Brand FU GANG TECHNOLOGY CO., LTD.
Origin Shenzhen, China
Related Standards IEC512, MIL-STD 202, EIA-364
ITEMDescriptionTest MethodsTest SpecificationReference
0B0BExamination of ProductVisual inspectionOutward appearance shall be good without such injurious problem and structure shall be meet the design and dimension requirement of drawing.EIA364-18
1B1BInsertion forceMeasure force at maximum rate of 12.5mm (0.492") per minuteThe connector insertion force shall be the range from 5N to 20NEIA 364-13
2B2BExtraction forceMeasure force at maximum rate of 12.5mm(0.492") per minuteThe connector extraction force shall be the range from 8N to 20NEIA 364-13
3DurabilityType C :5000 cycles cycle rate of 200cycles per hour manually- Contact resistance (40m, delta 10m(Max) after test)
- Insertion force (5N to 20N)
- Extraction force (8N to 20N)
- Visual inspection (no exposed base metal on contacts)
EIA 364-09
4Cable Flexing100 cycles in each of 2 planes 120 degree. Dimension x=3.7x cable diameterNo discontinuity over 1 microsecond During flexing or physical damage allowedEIA 364-41
5Cable Pull-Out40N steady state axial load for 1 minuteNo discontinuity or physical damage allowedEIA-364-38
64-axes continuity testNo discontinuity greater than 1us and no physical damage to the specimen(one cable per test)EIA364-18
7-1Insulation ResistanceUnmated connecrors,apply 100Volts DC between adjacent terminal or ground.100m minimum(unmated)between adjacent contacts and contacts and shellEIA 364-21C
7-2Low Level Contact Resistance20mV Max. open circuit at 100mA Max.40m (Max) initial for VBUS and GND contacts and all other contacts; delta 10m (Max) after testEIA 364-23b
7-3Dielectric withstanding VoltageSubjected to 100VAC (RMS) for 1 minute between adjacent terminalsThere shall be no breakdownEIA 364-20
7-4Contact current rating5.0A shall be applied collectively to VBUS pins and 1.25 A applied to the VCONN pin and 0.25 A the other contacts. When the currents are applied to the contacts, the temperature rise shall not exceed 30 C at any point on the USB Type-C mated plug and receptacle under test, when measured at an ambient temperature of 25 C.EIA364-70
8-1Temperature Life105 C without applied voltage for 120 hours. 105 C without applied voltage for 72 hours when used as preconditioning in EIA 364-1000.01.Visual inspection, Test shall be done in sequences defined in EIA 364-1000.01.EIA 364-17
8-2Thermal Shock10 Cycles -55 and +85. The USB 3.0 connectors under test must be mated.There shall be no evidence of any physical damage.EIA 364-32
8-3Salt SpraySubject mated connectors to 24 hours at 35 with 5%-Salt-solution concentration.1).Shall meet visual requirement, show no physical damage.
2).Shall meet requirements of additional tests as specified in test sequence in Section 5
MIL-STD-202F, Method 101D, Test Condition B
8-4Cyclic Temperature and Humiditycycle the connector or socket between 253at 80%3%RH and 653at 50%3%RH,ramp times should be 0.5hour and dwell times should be 1.0 hour.24 cyclesVisual inspection, Test shall be done in sequences defined in EIA 364-1000.01.EIA 364-31
8-5Solder abilitysoldered at temperature 260+/-5 at a rate of 25.4mm+/-6.35mm per second for in immersion duration 5s.solder shall cover a minimum of 95% of the surface being immersedEIA 364-52
8-6Resistance to Reflow Soldering HeatNo damage.EIA 364-17A
8-7Temperature LifeSubject mated connectors to temperature life at 80 for 250hours1).Shall meet visual requirement, show no physical damage.
2).Shall meet requirements of additional tests as specified in test sequence in Section 5
EIA 364-17
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