| 7.1 Insulation Resistance | Unmated connectors, apply 100Volts DC between adjacent contacts and
contacts and ground. | EIA 364-21C | 100M minimum (unmated) |
| 7.2 Low Level Contact Resistance | 100m A max., 20mV Max. open circuit at 100mA Max. | EIA 364-23b | 40m(Max) initial for VBUS and GND contacts and all other contacts;
delta Max. 10m(Max) after test |
| 7.3 Dielectric Withstanding Voltage | Subjected to 100VAC (RMS) for 1 minute between adjacent terminals. | EIA 364-20 | There shall be no breakdown |
| 7.4 Contact Current Rating | 5.0A shall be applied collectively to VBUS pins and 1.25 A applied
to the VCONN pin and 0.25 A the other contacts. | EIA364-70 | When the currents are applied to the contacts, the temperature rise
shall not exceed 30 C at any point on the USB Type-C mated plug and
receptacle under test, when measured at an ambient temperature of
25 C. |
| 6.1 Durability | Type C :10000 cycles | EIA 364-09 | Must meet the following criteria after the cycle test is completed:
Contact resistance (40m > delta 10m (Max) after test), Insertion
force (5N to 20N), Extraction force (8N to 20N), Visual inspection
(no exposed base metal on contacts) |
| 6.2 Cable Flexing | 100 cycles in each of 2 planes 120 degree. Dimension x=3.7x cable
diameter | EIA 364-41 | No discontinuity over 1 microsecond During flexing or physical
damage allowed |
| 6.3 Cable Pull-Out | 40 N steady state axial load for 1 minute | EIA-364-38 | No discontinuity or physical damage allowed |
| 6.4 4-axes continuity test | 8N tensile force for a period of 10 seconds Min; The specimen must
subject to 0 ,90 ,180 ,270 direction. | EIA364-18 | No discontinuity greater than lus and no physical damage to the
specimen(one cable per test) |
| 8.1 Temperature Life | 105 C without applied voltage for 120 hours. 105 C without applied
voltage for 72 hours when used as preconditioning in EIA
364-1000.01. | EIA 364-17 | Visual inspection, Test shall be done in sequences defined in EIA
364-1000.01. |
| 8.2 Thermal Shock | 10 Cycles - 55C and +85C. The USB 3.0 connectors under test must be
mated. | EIA 364-32 | There shall be no evidence of any physical damage. |
| 8.3 Salt Spray | Subject mated connectors to 48 hours at 35 C with 5%-Salt-solution
concentration. | MIL-STD-202F, Method 101D, Test Condition B | 1).Shall meet visual requirement, show no physical damage. 2).Shall
meet requirements of additional tests as specified in test sequence
in Section 5 |
